Paper Title:
Relationship between the EPR SI-5 Signal and the 0.65 eV Electron Trap in 4H- and 6H-SiC Polytypes
  Abstract

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Periodical
Materials Science Forum (Volumes 527-529)
Edited by
Robert P. Devaty, David J. Larkin and Stephen E. Saddow
Pages
547-550
DOI
10.4028/www.scientific.net/MSF.527-529.547
Citation
N.Y. Garces, W.E. Carlos, E.R. Glaser, S. W. Huh, H. J. Chung , S. Nigam, A.Y. Polyakov, M. Skowronski, "Relationship between the EPR SI-5 Signal and the 0.65 eV Electron Trap in 4H- and 6H-SiC Polytypes", Materials Science Forum, Vols. 527-529, pp. 547-550, 2006
Online since
October 2006
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