Materials Science & Technology

FULLTEXT SEARCH
NEW: Advanced Search

In Situ Observation of Mass Transfer in the CF-PVT Growth Process by X-Ray Imaging

Journal Materials Science Forum (Volumes 527 - 529)
Volume Silicon Carbide and Related Materials 2005
Edited by Robert P. Devaty, David J. Larkin and Stephen E. Saddow
Pages 63-66
DOI 10.4028/www.scientific.net/MSF.527-529.63
Citation Didier Chaussende et al., 2006, Materials Science Forum, 527-529, 63
Online since October, 2006
Authors Didier Chaussende, Peter J. Wellmann, M. Ucar, Michel Pons, Roland Madar
Keywords Bulk Growth, HTCVD, Mass Transfer, Sublimation, X-Ray
Abstract

The development of the Continuous Feed Physical Vapour Transport (CF-PVT) process requires a perfect control of each phenomenon in the growth cell. Along this line, the present paper gives some inputs on the CF-PVT mass transfer regimes with respect to the process parameters, both from qualitative and quantitative viewpoints. For example, two boundary cases have been evidenced depending on the temperature. At low temperature, the growth is limited by the sublimation step between the source and the seed. In this case, the CF-PVT process can be roughly assimilated to the classical seeded sublimation technique. At high temperature, the process is limited by the feeding step, i.e. the CVD deposition and infiltration on the lower part of the source. Measurements are correlated to in-situ X-ray imaging. The ability of the X-ray imaging to in-situ qualify and quantify the mass transfer is discussed.

Full Paper PDF Get the full paper by clicking here

First page example

Preview of first page