Paper Title:
Characterisation of Solid Supported Nanostructured Thin Films by Scanning Angle Reflectometry and UV-Vis Spectrometry
  Abstract

Nanostructured Langmuir-Blodgett (LB) films of Stöber-silica nanoparticles have been prepared on silicon and quartz glass substrates. The deposited layers were investigated using scanning angle reflectometry and UV-Vis spectroscopy. The reflectivity and the transmittance spectra of the LB films were evaluated using a model based on thin layer optics. Film thickness and effective refractive index of the films were determined. From the refractive index values the volume fraction of the particles in the film was estimated by effective medium approach.

  Info
Periodical
Materials Science Forum (Volumes 537-538)
Edited by
J. Gyulai and P.J. Szabó
Pages
329-336
DOI
10.4028/www.scientific.net/MSF.537-538.329
Citation
A. Deák, E. Hild, A. L. Kovács, Z. Hórvölgyi, "Characterisation of Solid Supported Nanostructured Thin Films by Scanning Angle Reflectometry and UV-Vis Spectrometry ", Materials Science Forum, Vols. 537-538, pp. 329-336, 2007
Online since
February 2007
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