Fine-grained fully lamellar (FGFL) structures of XD TiAl alloys (Ti-45 and 47Al-2Nb-2Mn+0.8vol.%TiB2) (at.%) were stabilized to varying degrees by different aging treatments. Specimens with and without aging were creep tested at 760°C and 207 MPa. It was found that during creep deformation, degradation of the lamellar structure involving coarsening within the colonies and spheroidization at colony boundaries occurred, forming fine globular structures at the colony boundaries and increasing the creep rate. Aging treatments stabilized the lamellar structure and retarded the coarsening and spheroidization processes during creep deformation. As a result, the aged specimens exhibited lower minimum creep rates and longer creep lives than the unaged specimens. A multiple step aging stabilized the lamellar structure to the greatest extent and suppressed other degradation processes during aging, resulting in the best creep resistance. These results demonstrate that the multiple step aging is the optimal aging condition for stabilizing FGFL XD TiAl alloys.