Paper Title:

3-Dimensional Characterization of Polycrystalline Bulk Materials Using High-Energy Synchrotron Radiation

Periodical Materials Science Forum (Volumes 539 - 543)
Main Theme THERMEC 2006
Edited by T. Chandra, K. Tsuzaki, M. Militzer , C. Ravindran
Pages 2353-2358
DOI 10.4028/www.scientific.net/MSF.539-543.2353
Citation Ulrich Lienert et al., 2007, Materials Science Forum, 539-543, 2353
Online since March 2007
Authors Ulrich Lienert, Jonathan Almer, Bo Jakobsen, Wolfgang Pantleon, Henning Friis Poulsen, D. Hennessy, C. Xiao, R.M. Suter
Keywords High Energy Synchrotron Radiation, In Situ Deformation, Microstructure, Polycrystalline Material, X-Ray Diffraction (XRD)
Price US$ 28,-
Share
Article Preview
View full size

The implementation of 3-Dimensional X-Ray Diffraction (3DXRD) Microscopy at the Advanced Photon Source is described. The technique enables the non-destructive structural characterization of polycrystalline bulk materials and is therefore suitable for in situ studies during thermo-mechanical processing. High energy synchrotron radiation and area detectors are employed. First, a forward modeling approach for the reconstruction of grain boundaries from high resolution diffraction images is described. Second, a high resolution reciprocal space mapping technique of individual grains is presented.

No comments in this document.