Paper Title:
Particle-In-Cell Modelling of a Neutral Beam Source for Material Processing in Nanoscale Structures Fabrication
  Abstract

Neutral beam processing has evolved into one of the most promising methods for overcoming plasma process induced damage. Surface treatment by neutrals avoids problems with surface charging effects, frequently encountered when using common ion treatment, especially for low k-materials. In this paper, the influence of various parameters on the neutralization of ion beams in Ar-CF4 mixture based on a Particle in Cell with Monte Carlo collisions (PIC/MCC) simulation is studied. The efficiency of neutralization has been treated by considering both surface neutralization of ions and collisions of ions in the gas.

  Info
Periodical
Edited by
Dragan P. Uskoković, Slobodan K. Milonjić and Dejan I. Raković
Pages
47-52
DOI
10.4028/www.scientific.net/MSF.555.47
Citation
M. Radmilović-Radjenović, Z.L. Petrović, Ž. Nikitović, A. Strinić, V. Stojanović, A. Nina, B. Radjenović, "Particle-In-Cell Modelling of a Neutral Beam Source for Material Processing in Nanoscale Structures Fabrication", Materials Science Forum, Vol. 555, pp. 47-52, 2007
Online since
September 2007
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