Paper Title:
In Situ X-Ray Measurements of Defect Generation during PVT Growth of SiC
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 556-557)
Edited by
N. Wright, C.M. Johnson, K. Vassilevski, I. Nikitina and A. Horsfall
Pages
267-270
DOI
10.4028/www.scientific.net/MSF.556-557.267
Citation
K. Konias, R. Hock, M. Stockmeier, P. J. Wellmann, M. Miller, S. Ossege, A. Magerl, "In Situ X-Ray Measurements of Defect Generation during PVT Growth of SiC", Materials Science Forum, Vols. 556-557, pp. 267-270, 2007
Online since
September 2007
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Price
$32.00
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