Paper Title:
Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers
  Abstract

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Periodical
Materials Science Forum (Volumes 556-557)
Edited by
N. Wright, C.M. Johnson, K. Vassilevski, I. Nikitina and A. Horsfall
Pages
327-330
DOI
10.4028/www.scientific.net/MSF.556-557.327
Citation
M. Wagner, E. Mustafa, S. Hahn, M. Syväjärvi, R. Yakimova, S. Jang, S. A. Sakwe, P. J. Wellmann, "Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers", Materials Science Forum, Vols. 556-557, pp. 327-330, 2007
Online since
September 2007
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Price
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