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Authors: Tom Ryan, John Hennessy, Colin Harrison, Shou Yin Wang, Gyles Webster, Akihiko Majima
Abstract:The commercial availability of SiC-based devices has been limited by a number of factors including wafer supply, cost, wafer size and...
299
Authors: Nobuyoshi Yashiro, Kazuhiko Kusunoki, Kazuhito Kamei, Akihiro Yauchi
Abstract:We carried out the characterization of the crystallinity of the solution growth self-standing silicon carbide (SiC) crystals, which were...
303
Authors: Gerhard Pensl, Frank Schmid, Sergey A. Reshanov, Heiko B. Weber, M. Bockstedte, Alexander Mattausch, Oleg Pankratov, Takeshi Ohshima, Hisayoshi Itoh
Abstract:Nitrogen (N) donors in SiC are partially deactivated either by Si+-/N+-co-implantation or by irradiation with electrons of 200 keV energy...
307
Authors: John W. Steeds
Abstract:Use of a transmission electron microscope to irradiate silicon carbide samples has been demonstrated as a useful additional characterisation...
313
Authors: W. Sullivan, John W. Steeds
Abstract:The high-temperature persistent PL defect known as DII is commented on within this study, seen for the first time in low-energy electron...
319
Authors: Gil Yong Chung, Mark J. Loboda, Mike F. MacMillan, Jian Wei Wan, Darren M. Hansen
Abstract:Excess carrier lifetimes in 4H SiC epitaxial wafers were characterized by microwave photoconductive decay (o/PCD). The measured decay...
323
Authors: Matthias Wagner, E. Mustafa, S. Hahn, Mikael Syväjärvi, Rositza Yakimova, S. Jang, Sakwe Aloysius Sakwe, Peter J. Wellmann
327
Authors: Katsunori Danno, Tsunenobu Kimoto
Abstract:The authors have investigated deep levels in electron-irradiated n- and p-type 4H-SiC epilayers by deep level transient spectroscopy (DLTS)....
331
Authors: Satoshi Murata, Yoshihiro Nakamura, Tomohiko Maeda, Yoko Shibata, Mina Ikuta, Masaaki Sugiura, Shugo Nitta, Motoaki Iwaya, Satoshi Kamiyama, Hiroshi Amano, Isamu Akasaki, Masahiro Yoshimoto, Tomoaki Furusho, Hiroyuki Kinoshita
Abstract:The dependence of donor-acceptor pair (DAP) emission properties on impurity concentrations of N and B in 6H-SiC epilayers was investigated....
335
Authors: W.S. Loh, C. Mark Johnson, J.S. Ng, Peter M. Sandvik, Steve Arthur, Stanislav I. Soloviev, J.P.R. David
Abstract:Hole initiated avalanche multiplication characteristics of 4H-SiC avalanche photodiodes have been studied. The diodes had n+-n-p SiC...
339
Showing 71 to 80 of 248 Paper Titles