Paper Title:
Mapping Partially Recrystallised Structures by 3DXRD
  Abstract

A partially recrystallised sample has been characterised by 3DXRD. A gauge volume of 200μm × 700μm × 300μm has been fully mapped. Deformed and recrystallised regions within the selected gauge volume are distinguished based on the sharpness of the diffraction spots. Information corresponding to a 5D (Φ1, Φ, Φ2, z, x · y) map is deducted from the 3DXRD data.

  Info
Periodical
Materials Science Forum (Volumes 558-559)
Edited by
S.-J.L. Kang, M.Y. Huh, N.M. Hwang, H. Homma, K. Ushioda and Y. Ikuhara
Pages
389-394
DOI
10.4028/www.scientific.net/MSF.558-559.389
Citation
S.S. West, G. Winther, L. Margulies, E. Knudsen, H. O. Sørensen, S. Schmidt, D. Juul Jensen, "Mapping Partially Recrystallised Structures by 3DXRD", Materials Science Forum, Vols. 558-559, pp. 389-394, 2007
Online since
October 2007
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Price
$32.00
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