Paper Title:
Three-Dimensional Microstructure Reconstruction Using FIB-OIM
  Abstract

A new method for reconstructing a three-dimensional microstructure using the focused ion beam-orientation imaging microscopy (FIB-OIM) is introduced. The technique is important for the study of three-dimensional microstructures of materials because it can automatically align (register) a series of parallel sections with both topological information and orientation information at the sub-micrometer scale. Using voxel-based tessellation, a three-dimensional microstructure is reconstructed by registering each section. The application of the method to a cubic material is described and, based on the reconstruction, the grain shape and grain size distribution are characterized.

  Info
Periodical
Materials Science Forum (Volumes 558-559)
Edited by
S.-J.L. Kang, M.Y. Huh, N.M. Hwang, H. Homma, K. Ushioda and Y. Ikuhara
Pages
915-920
DOI
10.4028/www.scientific.net/MSF.558-559.915
Citation
S. B. Lee, A. D. Rollett, G. S. Rohrer, "Three-Dimensional Microstructure Reconstruction Using FIB-OIM", Materials Science Forum, Vols. 558-559, pp. 915-920, 2007
Online since
October 2007
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Price
$32.00
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