Paper Title:
Formation of Defect Clusters in SrTiO3 Crystals Implanted with Xenon Ions
  Abstract

SrTiO3 crystals were implanted with 100 keV xenon (Xe+) ions at 673 or 1073 K up to 2.0 × 1020 ions m−2. Defect clusters formed in the ion-implanted samples were investigated with conventional and high-resolution transmission electron microscopy. Nanometer-sized clusters were formed in the samples. The clusters grew large in size after post-implantation annealing and with increasing the implantation dose. The clusters were faceted with {100}, or {110} of SrTiO3. Though the nano-sized clusters were expected to contain Xe atoms, they were not in crystalline state. The results suggest that even if the clusters contain Xe atoms, they also contain other point defects such as vacancies.

  Info
Periodical
Materials Science Forum (Volumes 561-565)
Main Theme
Edited by
Young Won Chang, Nack J. Kim and Chong Soo Lee
Pages
1757-1760
DOI
10.4028/www.scientific.net/MSF.561-565.1757
Citation
M. H. Song, X. J. Guo, N. Ishikawa, M. Takeguchi, K. Mitsuishi, K. Furuya, "Formation of Defect Clusters in SrTiO3 Crystals Implanted with Xenon Ions", Materials Science Forum, Vols. 561-565, pp. 1757-1760, 2007
Online since
October 2007
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