Paper Title:
"In Situ-Tracking” Observation of Stainless Steel Microstructural Development during Elevated Service Using EBSD and SEM
  Abstract

Electron backscatter diffraction (EBSD) has been developed as a novel technique for characterizing crystallographic textures in recent years. The present paper proposes an “in-situ-tracking” approach using SEM and EBSD to examining the microstructural development and grain boundary variation of stainless steel during elevated 1200 °C service. The results revealed that in addition to the coarsened grains the fraction of low angle grain boundaries (LABG) became increased and flattened obviously during service. Comparing to the regular high temperature service (below 900 °C), the present “recovery and recrystallization” process was accelerated due to dislocation fastened movement and intensive interaction. However, the grain growth mechanism still meet the well-accepted dislocation model of subgrain combination.

  Info
Periodical
Materials Science Forum (Volumes 561-565)
Main Theme
Edited by
Young Won Chang, Nack J. Kim and Chong Soo Lee
Pages
2087-2090
DOI
10.4028/www.scientific.net/MSF.561-565.2087
Citation
Y. M. Huang, Q. Fu, C. X. Pan, ""In Situ-Tracking” Observation of Stainless Steel Microstructural Development during Elevated Service Using EBSD and SEM", Materials Science Forum, Vols. 561-565, pp. 2087-2090, 2007
Online since
October 2007
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