Paper Title:
Reliable Titanium Aluminide Texture Measurement Using EBSD
  Abstract

γ-TiAl has a tetragonal structure that is almost cubic (c/a ≈ 1.02). As a result of this, the electron backscatter diffraction patterns (EBSPs) of orientations related by 90°<100] rotations are almost identical. Reliable orientation measurement during automated EBSD mapping requires distinguishing very small differences in the positions of certain bands within the EBSPs. EBSD was used to measure the micro-texture and bulk texture of γ-TiAl hot-deformed under conditions approximating plane-strain compression. The reliability and accuracy of the indexing was assessed by inspecting the orientation maps for misindexing and by comparing the texture measured using EBSD with that measured using X-ray diffraction (XRD). Using Advanced Fit refinement and high-resolution EBSPs produced reliable and accurate results. Substantial misindexing was present when the EBSPs were indexed using the Hough transform method alone.

  Info
Periodical
Materials Science Forum (Volumes 561-565)
Main Theme
Edited by
Young Won Chang, Nack J. Kim and Chong Soo Lee
Pages
431-434
DOI
10.4028/www.scientific.net/MSF.561-565.431
Citation
M. Nave, H. Inoue, "Reliable Titanium Aluminide Texture Measurement Using EBSD", Materials Science Forum, Vols. 561-565, pp. 431-434, 2007
Online since
October 2007
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Price
$32.00
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