Paper Title:
Application of Synchrotron Radiation to Residual Stress Analysis by IP/cosα Method
  Abstract

The X-ray stress measurement with synchrotron radiation (SR) and an image plate (IP) was conducted using the facility of the Photon Factory (PF) of the High Energy Accelerator Research Organization (KEK). The influence of 2θ on stress measurement with the cosα method was investigated. The experiments were conducted under the conditions of 2θ=170 deg, 156.4 deg and 127 deg respectively. It was found that the hypothesis on the relation between the accuracy and the diffraction angle in the X-ray method is not valid in case of the cosα method.

  Info
Periodical
Materials Science Forum (Volumes 571-572)
Edited by
A. R. Pyzalla, A. Borbély and H.-P. Degischer
Pages
249-254
DOI
10.4028/www.scientific.net/MSF.571-572.249
Citation
T. Sasaki, Y. Miyazawa, S. Takahashi, R. Matsuyama, K. Sasaki, K. Hiratsuka, "Application of Synchrotron Radiation to Residual Stress Analysis by IP/cosα Method", Materials Science Forum, Vols. 571-572, pp. 249-254, 2008
Online since
March 2008
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$32.00
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