Paper Title:
Reliability Evaluation of QFP Solder Joint Using Sn-8Zn-3Bi Solder Paste during the Thermal Shock Test
  Abstract

The reliability of QFP (Quad flat package) solder joint using Sn-8Zn-3Bi solder paste under the thermal shock test was investigated. Considering the environmental restriction such as ROHS, the QFP Cu LF (Lead-frame) was coated with lead-free materials (Sn, Sn-3Bi). To analyze the reliability under thermal shock treatment, the samples were placed in the thermal shock chamber (248K/423K, Dwell time: 30min). During the thermal shock test, the solder joint cross-sections were observed every 500 cycles. No crack initiation and propagation was observed through all type of plated Cu LF. The measured pull strength slightly decreased, as the number of cycles increased. After 1000 cycles, the pull strength of Sn and SnBi plated Cu LF reduced by 30% and 20%, respectively, compared with that of initial condition. Observing the fracture surface morphology by FE-SEM, the fracture mode changed and the IMC fractured area on the both fracture surface was increased. The IMC was identified as γ-Cu5Zn8 by chemical composition analysis using EDS. The reduced pull strength was affected by IMC fracture and fracture mode change. However, the pull strength does not decrease steeply but gradually. Consequently, the Sn-8Zn-3Bi solder joint shows the reliable solder joint strength, fracture mechanism, and compatibility with lead-free plated Cu LF during the thermal shock temperature of 248K to 423K.

  Info
Periodical
Materials Science Forum (Volumes 580-582)
Edited by
Changhee Lee, Jong-Bong Lee, Dong-Hwan Park and Suck-Joo Na
Pages
247-250
DOI
10.4028/www.scientific.net/MSF.580-582.247
Citation
S.W. Han, K. H. Chang, J.G. Han, I. J. Cho, J. M. Kim, M.G. Choi, Y.T. Kim, Y. E. Shin, "Reliability Evaluation of QFP Solder Joint Using Sn-8Zn-3Bi Solder Paste during the Thermal Shock Test", Materials Science Forum, Vols. 580-582, pp. 247-250, 2008
Online since
June 2008
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Price
$32.00
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