Paper Title:
Semiconducting YBCO Thin Films for Uncooled Terahertz Imagers
  Abstract

The terahertz domain (500 GHz - 5 THz) has been object of unceasing research activities, due to the wide range of conceivable applications in these fields. This study focuses on the development of semiconducting YBa2Cu3O6+x (YBCO) thin films to be used as sensitive elements on future uncooled terahertz imagers working on a thermal principle. YBCO thin films have been hollow-cathode sputtered on MgO single-crystals under different conditions. Electrical and structural characterizations have then been carried out. The resistivity of the thin films and the temperature coefficient of resistance (TCR) have been determined. X-ray diffraction and atomic force microscopy analyses have then been performed. If compared with materials currently used as sensing element in commercial near-infrared imagers, electrical characterization shows values of the TCR comparable to amorphous silicon and almost two times better than VOx-compounds.

  Info
Periodical
Materials Science Forum (Volumes 587-588)
Edited by
António Torres Marques, António Fernando Silva, António Paulo Monteiro Baptista, Carlos Sá, Fernando Jorge Lino Alves, Luís Filipe Malheiros and Manuel Vieira
Pages
273-277
DOI
10.4028/www.scientific.net/MSF.587-588.273
Citation
M. Longhin, A. J. Kreisler, A. F. Dégardin, "Semiconducting YBCO Thin Films for Uncooled Terahertz Imagers", Materials Science Forum, Vols. 587-588, pp. 273-277, 2008
Online since
June 2008
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Price
$32.00
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