The all oxide magnetic multilayer system [LaNiO3/SmFeO3]n (for n = 1 and 2), grown on single crystal SrTiO3(100) substrates, has been produced using the laser MBE (Molecular Beam Epitaxy) technique. We have made a systematic study of the electrical transport properties in the temperature range from 15–300K. As part of this work, we have made a detailed study of the metallic properties of the LaNiO3 layer as a function of the oxygen partial pressure (pO2) and substrate temperature (TS). We have measured magnetic layers of SmFeO3 with LaNiO3 electrodes as a function of the magnetic layer thickness (10 – 470 nm). A non-metallic behaviour is observed with evidence of a “hopping” mechanism at low temperatures. For the n = 2 multilayers, we have measured the temperature dependence of resistance for the sample series with varying LaNiO3 interlayer thickness (t = 2 – 30 nm). We observe an appreciable increase of the low temperature resistance for the interlayer thicknesses between 3.75 – 7.5 nm. This could indicate a change in coupling from ferromagnetic to antiferromagnetic between the magnetic layers.