Paper Title:
Void Formation in Growing Oxide Scales with Schottky Defects and P-Type Conduction
  Abstract

A quantitative elucidation of the void formation in a growing scale with Schottky defects and p-type conduction during high temperature oxidation of metals. The evaluation of the divergence of ionic fluxes indicates that (1) Voids form in the scale preferentially in the vicinity of the metal/scale interface, (2) The volume of voids increases in a parabolic manner, (3) The volume fraction of voids and the scale is independent of time. The comparison between the calculation and the experimentally observed scale microstructure of NiO and CoO confirmed well the validity of the prediction.

  Info
Periodical
Materials Science Forum (Volumes 595-598)
Edited by
Pierre Steinmetz, Ian G. Wright, Alain Galerie, Daniel Monceau and Stéphane Mathieu
Pages
1039-1046
DOI
10.4028/www.scientific.net/MSF.595-598.1039
Citation
T. Maruyama, K. Akiba, M. Ueda, K. Kawamura, "Void Formation in Growing Oxide Scales with Schottky Defects and P-Type Conduction", Materials Science Forum, Vols. 595-598, pp. 1039-1046, 2008
Online since
September 2008
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