Paper Title:
High Resolution MicroRaman Study of Blisters in Cr2O3 Thermal Oxide Films
  Abstract

Using Raman microprobe spectroscopy made it possible to study the buckling phenomenon in chromia films grown at 900°C in air from a Ni30at%Cr alloy. Blisters have been optically observed to be circular and, from the top view, the mean radius has been measured with an accuracy of about 1%m. An autofocus device allows the characterisation of the profile of each blister and the shift of the A1g Raman peak of chromia gave the local stress far from the blister and all along the buckled zone. From these observations, the induced spalling has been related to the blister morphology.

  Info
Periodical
Materials Science Forum (Volumes 595-598)
Edited by
Pierre Steinmetz, Ian G. Wright, Alain Galerie, Daniel Monceau and Stéphane Mathieu
Pages
889-896
DOI
10.4028/www.scientific.net/MSF.595-598.889
Citation
M. Kemdehoundja, J. L. Grosseau-Poussard, J.F. Dinhut, G. Bonnet, "High Resolution MicroRaman Study of Blisters in Cr2O3 Thermal Oxide Films", Materials Science Forum, Vols. 595-598, pp. 889-896, 2008
Online since
September 2008
Keywords
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Price
$32.00
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