Paper Title:
Correlation between Screw Dislocations Distribution and Cathodoluminescence Spectra of InGaN Single Quantum Well Films
  Abstract

We have studied InGaN single-quantum-well (SQW) films using atomic force microscopy (AFM) and cathodoluminescence (CL) spectroscopy. It has been found that a screw dislocations (SDs) distribution in the height image by AFM is well correlated with images of the CL spectra at about 440nm assigned to the spontaneous emission from the InGaN SQW. These results at least mean an existence of non-radiative recombination centers within the InGaN SQW films. It has been also found that the average period of the peak-intensity and the FWHM change is smaller than that of the peak-wavelength change assigned to InN mole fluctuations. These results suggest that the exciton diffusion length of the spontaneous emission at about 440nm is not larger than the average period of InN mole fluctuations in the InGaN SQW.

  Info
Periodical
Materials Science Forum (Volumes 600-603)
Edited by
Akira Suzuki, Hajime Okumura, Tsunenobu Kimoto, Takashi Fuyuki, Kenji Fukuda and Shin-ichi Nishizawa
Pages
1309-1312
DOI
10.4028/www.scientific.net/MSF.600-603.1309
Citation
T. Fujita, T. Mitani, M. Murakami, M. Yoshikawa, H. Harima, "Correlation between Screw Dislocations Distribution and Cathodoluminescence Spectra of InGaN Single Quantum Well Films", Materials Science Forum, Vols. 600-603, pp. 1309-1312, 2009
Online since
September 2008
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: X. Zhang, Seo Young Ha, M. Benamara, Marek Skowronski, Joseph J. Sumakeris, Sei Hyung Ryu, Michael J. Paisley, Michael J. O'Loughlin
Abstract:Structure of the “carrot” defects in 4H-SiC homoepitaxial layers deposited by CVD has been investigated by plan-view and cross-sectional...
327
Authors: Ken Nishida, Minoru Osada, Shintaro Yokoyama, Takafumi Kamo, Takashi Fujisawa, Keisuke Saito, Hiroshi Funakubo, Takashi Katoda, Takashi Yamamoto
Abstract:Micro-patterned Pb(Zr,Ti)O3 (PZT) films with dot-pattern were grown by metal organic chemical vapor phase deposition (MOCVD). Micro-patterned...
135
Authors: Xue Tao Yuan, Dong Bai Sun, Zhi Qiang Hua, Lei Wang
Abstract:The growth morphology and structure of deposits during the initial stages of amorphous Ni-P electrodeposition was studied using atomic force...
535
Authors: Zheng Min Li, Zhi Wei Chen, Min Tan, Ke Jing Xu, Bing Jiang
Abstract:Nano-TiO2 coating film is one of the efficient photocatalysts. The particle size distribution of TiO2 has important influence on...
22
Authors: Zhi Yin Lee, Siti Aisyah binti Osman, Chee Yong Fong, Sha Shiong Ng
Chapter 8: Thin Film Materials and Devices
Abstract:The study signifies the radio-frequency (RF) sputtering growth and characterizations of indium nitride (InN) thin films deposited on flexible...
650