Diamond Doped by Hot Ion Implantation |
|
| Journal | Materials Science Forum (Volumes 600 - 603) |
|---|---|
| Volume | Silicon Carbide and Related Materials 2007 |
| Edited by | Akira Suzuki, Hajime Okumura, Tsunenobu Kimoto, Takashi Fuyuki, Kenji Fukuda and Shin-ichi Nishizawa |
| Pages | 1353-1356 |
| DOI | 10.4028/www.scientific.net/MSF.600-603.1353 |
| Citation | Nobuteru Tsubouchi et al., 2008, Materials Science Forum, 600-603, 1353 |
| Online since | September, 2008 |
| Authors | Nobuteru Tsubouchi, M. Ogura, H. Watanabe, Akiyoshi Chayahara, Hideyo Okushi |
| Keywords | Diamond, Doping, Electrical Property, Hot Ion Implantation, P, S |
| Abstract | Multiple P or S hot ion implantation to diamond substrates was performed at 800°C. Optical absorption spectra indicated that instantaneous annealing during hot ion implantation occurs. Temperature dependence of resistance demonstrated that a P as-implanted sample using a homoepitaxial diamond film substrate emerges a weak doping effect. Also on S implantation, a presence of a weak doping effect was observed in an as-implanted sample, but it was suggested that the dopant is not S itself but S and defect complex. However, post-implantation annealing resulted in high resistance of the samples and missing of such weak doping effects. |
| Full Paper |
Get the full paper by clicking here
|
