Paper Title:
The Effect of Nitridation on SiC MOS Oxides as Evaluated by Charge Pumping
  Abstract

We have analyzed the effect of post-oxidation nitride anneals (usually with either NO or N2O gases) on SiC MOSFETs. Two 4H:SiC wafers were identically prepared except that one wafer had a nitridation anneal after the gate oxide was formed, while the other was tested as-oxidized. We compared the two processes by making measurements on lateral MOSFETs and MOS capacitors using ID-VGS, C-V, and charge pumping. There was no change in either flatband voltage or interface trap density near the valence band, suggesting that the net fixed charge remained constant (within a few 1011cm-2). However, there was a large shift in the threshold voltage which, when combined with the C-V results, indicates a strong reduction of interface traps near the conduction band of roughly 6.0x1012cm-2 by using the nitridation process. The charge pumping measurements also showed a strong reduction of interface traps. Charge pumping measured a trapping density of 2.5x1012cm-2 for the as-oxidized samples and 5.3x1011cm-2 for the nitrided samples. The frequency-dependence of the charge pumping signal also indicates a spatial distribution of traps, with volumetric trap densities of roughly 1.3x1019cm-3 over 25Å on as-oxidized and 3.8x1018cm-3 over 19Å for nitrided.

  Info
Periodical
Materials Science Forum (Volumes 600-603)
Edited by
Akira Suzuki, Hajime Okumura, Tsunenobu Kimoto, Takashi Fuyuki, Kenji Fukuda and Shin-ichi Nishizawa
Pages
743-746
DOI
10.4028/www.scientific.net/MSF.600-603.743
Citation
D. B. Habersat, A. J. Lelis, J.M. McGarrity, F. B. McLean, S. Potbhare, "The Effect of Nitridation on SiC MOS Oxides as Evaluated by Charge Pumping", Materials Science Forum, Vols. 600-603, pp. 743-746, 2009
Online since
September 2008
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