Formation of Ordered Pores Determined by Positronium Time of Flight Spectroscopy |
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| Journal | Materials Science Forum (Volume 607) |
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| Volume | Positron and Positronium Chemistry |
| Edited by | S. J. Wang, Z. Q. Chen, B. Wang and Y. C. Jean |
| Pages | 201-203 |
| DOI | 10.4028/www.scientific.net/MSF.607.201 |
| Citation | Xiu Bo Qin et al., 2008, Materials Science Forum, 607, 201 |
| Online since | November, 2008 |
| Authors | Xiu Bo Qin, Run Sheng Yu, Toshikazu Kurihara, Xing Zhong Cao, Bao Yi Wang, Long Wei |
| Keywords | Evaporation Induced Self-Assembly (EISA), Mesoporous Silica, Positronium, Time-of-Flight (TOF) Spectroscopy |
| Abstract | We prepared a series of mesoporous silica films to study the structural information of ordered pores by positronium Time of Flight (Ps-TOF) spectroscopy. By changing the ratio of surfactant to silicon source, the pore structure is tuned. Results show that once ordered pores are formed, clear Ps TOF peak is observed. And the film with less distributed pore geometry leads to a narrowed Ps TOF peak. |
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