Paper Title:
Formation of Ordered Pores Determined by Positronium Time of Flight Spectroscopy
  Abstract

We prepared a series of mesoporous silica films to study the structural information of ordered pores by positronium Time of Flight (Ps-TOF) spectroscopy. By changing the ratio of surfactant to silicon source, the pore structure is tuned. Results show that once ordered pores are formed, clear Ps TOF peak is observed. And the film with less distributed pore geometry leads to a narrowed Ps TOF peak.

  Info
Periodical
Edited by
S. J. Wang, Z. Q. Chen, B. Wang and Y. C. Jean
Pages
201-203
DOI
10.4028/www.scientific.net/MSF.607.201
Citation
X. B. Qin, R. S. Yu, T. Kurihara, X. Z. Cao, B. Y. Wang, L. Wei, "Formation of Ordered Pores Determined by Positronium Time of Flight Spectroscopy", Materials Science Forum, Vol. 607, pp. 201-203, 2009
Online since
November 2008
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