Paper Title:
Ortho-Positronium Reemission Yield and Energy in Surfactant-Templated Mesoporous Silica Films
  Abstract

Positron annihilation gamma energy distribution, lifetime spectroscopy and time-of-flight method were used to study surfactant-templated mesoporous silica films deposited on glass. The lifetime depth profiling was correlated to Doppler broadening and 3γ annihilation fraction measurements to determine the annihilation characteristics inside the films. A set of consistent fingerprints for positronium annihilation, o-Ps reemission into vacuum, and pore size was directly determined. The lifetime measurements were performed in reflection mode with a specially designed lifetime spectrometer mounted on a slow positron beam system. The intensity of the 142 ns vacuum lifetime component was recorded as a function of the energy of the positron beam. In a film with high porosity a reemission efficiency of as high as 40 % was found at low positron energy. Positron lifetime in samples capped by a thin silica layer was used to determine the pore size. The energy of the reemitted o-Ps fraction was measured by a time-of-flight detector, mounted on the same system, allowing determination of both o-Ps re-emission efficiency and energy in the same sample. We demonstrate the potential of the simultaneous use of different positron annihilation techniques in the study of thin porous films.

  Info
Periodical
Edited by
S. J. Wang, Z. Q. Chen, B. Wang and Y. C. Jean
Pages
30-33
DOI
10.4028/www.scientific.net/MSF.607.30
Citation
L. Lizkay, C. Corbel, P. Perez, P. Desgardin, M. F. Barthe, T. Ohdaira, R. Suzuki, P. Crivelli, U. Gendotti, A. Rubbia, M. Etienne, A. Walcarius, "Ortho-Positronium Reemission Yield and Energy in Surfactant-Templated Mesoporous Silica Films", Materials Science Forum, Vol. 607, pp. 30-33, 2009
Online since
November 2008
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$32.00
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