Paper Title:
Characterization of Thin Layer SnO2/Glass by Neutrons Reflectometry
  Abstract

The thermal annealing behavior of the SnO2 thin films elaborated by sol-gel method has been studied by the neutrons reflectivity technique. From the fit of the experimental data using Parratt32 software program developed at HMI, Berlin, scattering length density, thickness and roughness are extracted. The obtained results show that the film thickness increases with the increasing annealing temperature, and the roughness is higher at 500 °C. Whereas, approximately, the same scattering length density is obtained after each annealing temperature.

  Info
Periodical
Edited by
N.Gabouze
Pages
155-160
DOI
10.4028/www.scientific.net/MSF.609.155
Citation
M. F. Khelladi, M. Izerrouken, S. Kermadi, R. Tala-Ighil, S. Sali, M. Boumaour, "Characterization of Thin Layer SnO2/Glass by Neutrons Reflectometry", Materials Science Forum, Vol. 609, pp. 155-160, 2009
Online since
January 2009
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