Paper Title:
Thin Layered Structures Analysis Using NUR Reflectometer
  Abstract

Reflectometry technique in Centre de Recherché Nucléaire de Draria (CRND) is operational since 2002. The instrument is used for investigation of monochromators and supermirrors. In this communication, several monochromators: 10 and 40 nickel-titanium bilayers deposited on a float-glass substrate with different period are analysed. The investigation of magnetic multilayers (25 silicon-iron bilayers monochromator) is also performed. From the results, Bragg peaks were identified indicating the periodicity of the multilayers.

  Info
Periodical
Edited by
N.Gabouze
Pages
53-58
DOI
10.4028/www.scientific.net/MSF.609.53
Citation
M. Izerrouken, "Thin Layered Structures Analysis Using NUR Reflectometer", Materials Science Forum, Vol. 609, pp. 53-58, 2009
Online since
January 2009
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