Paper Title:
AFM and Raman Studies of Graphene Exfoliated on SiC
  Abstract

We report an investigation of few layers graphene exfoliated on SiC. Using AFM and Raman spectroscopy, we find that the graphene thickness determined from the normalized intensity of Raman lines significantly depart from the one obtained using XPS.

  Info
Periodical
Materials Science Forum (Volumes 615-617)
Edited by
Amador Pérez-Tomás, Philippe Godignon, Miquel Vellvehí and Pierre Brosselard
Pages
215-218
DOI
10.4028/www.scientific.net/MSF.615-617.215
Citation
A. Tiberj, M. Martin, N. Camara, P. Poncharal, T. Michel, J.L. Sauvajol, P. Godignon, J. Camassel, "AFM and Raman Studies of Graphene Exfoliated on SiC", Materials Science Forum, Vols. 615-617, pp. 215-218, 2009
Online since
March 2009
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