Paper Title:
Effect of High Temperature Oxidation of 4H-SiC on the Near-Interface Traps Measured by TDRC
  Abstract

In this work the effect of oxidation temperature of 4H-SiC on the density of near-interface traps is studied. It is seen that the portion of traps with slower emission times decreases with increasing oxidation temperature. Despite this reduction, high temperature oxidation alone is not useful to achieve low density of interface traps at the SiO2/4H-SiC interface.

  Info
Periodical
Materials Science Forum (Volumes 615-617)
Edited by
Amador Pérez-Tomás, Philippe Godignon, Miquel Vellvehí and Pierre Brosselard
Pages
537-540
DOI
10.4028/www.scientific.net/MSF.615-617.537
Citation
F. Allerstam, E. Ö. Sveinbjörnsson, "Effect of High Temperature Oxidation of 4H-SiC on the Near-Interface Traps Measured by TDRC", Materials Science Forum, Vols. 615-617, pp. 537-540, 2009
Online since
March 2009
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