Paper Title
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Authors: Siegmund Greulich-Weber, M. Zöller, B. Friedel
Abstract:The solar cell concept presented here is based on 3C-SiC nano- or microwires and conju¬gated polymers. Therefore the silicon carbide wires...
239
Authors: Gan Feng, Jun Suda, Tsunenobu Kimoto
Abstract:The micro-photoluminescence (micro-PL) spectroscopy and its intensity mapping have been utilized to investigate the planar defects, stacking...
245
  | Authors: Ryohei Tanuma, Tae Tamori, Yoshiyuki Yonezawa, Hirotaka Yamaguchi, Hirofumi Matsuhata, Kenji Fukuda, Kazuo Arai
Abstract:This paper describes the study of non-hollow-core elementary screw dislocations (SDs) in silicon carbide (SiC) diodes using X-ray microbeam...
251
Authors: Jawad ul Hassan, Peder Bergman
Abstract:Thick 4H-SiC epitaxial layers have been characterized using high-resolution lifetime mapping. The lifetime maps are obtain by the detection...
255
Authors: Felix Oehlschläger, Sandrine Juillaguet, Hervé Peyre, Jean Camassel, Peter J. Wellmann
Abstract:Photoluminescence(PL)-topography is a powerful method to determine the charge carrier concentration of SiC-wafers. The following work...
259
Authors: Ivan G. Ivanov, Jawad ul Hassan, Anne Henry, Erik Janzén
Abstract:The paper presents experimental data on the temperature dependence and the excitation properties of the phosphorus-related photoluminescence...
263
Authors: Dorothea Werber, Gerhard Wachutka
Abstract:A change of the electron and hole densities n and p and of the lattice temperature T modulates the real optical refractive index nopt of...
267
Authors: Thierry Ouisse, Didier Chaussende, Laurent Auvray, Etienne Pernot, Roland Madar
Abstract:The dislocation-induced birefringence of Silicon Carbide (SiC) is analytically and quantitatively modelled by using the adequate SiC data. A...
271
Authors: Justinas Palisaitis, Peder Bergman, P.O.Å. Persson
Abstract:We have performed 2D X-ray diffraction mapping of the SiC lattice basal plane orientation over full 2” SiC substrates. Measurements of the...
275
Authors: Marina G. Mynbaeva, Alexander A. Lebedev
Abstract:An effective low-cost technique for rapid characterization of SiC ingots at the early stage of substrate manufacturing process is proposed....
279
Showing 61 to 70 of 247 Paper Titles