Paper Title:
OH Diffusion - on the Measurement of Concentration Profiles in Doped MCVD-Silica Layers Using a Color Center Laser
  Abstract

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Periodical
Materials Science Forum (Volumes 62-64)
Edited by
J. Barthel et al.
Pages
821-822
DOI
10.4028/www.scientific.net/MSF.62-64.821
Citation
G. Braun, J. Kirchhof, P. Kleinert, "OH Diffusion - on the Measurement of Concentration Profiles in Doped MCVD-Silica Layers Using a Color Center Laser", Materials Science Forum, Vols. 62-64, pp. 821-822, 1991
Online since
January 1991
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