Paper Title:
Characterisation of Ti/Al Multilayered Structures with Slow Positron Beams Applying a Simplified Positron Depth Distribution Model
  Abstract

In this work the depth of interfaces in multilayered structures was estimated. The fractions of positron annihilation as function of the implantation energy were estimated from an S-W plot and then converted into a function of the sample depth through the positron implantation profile in the multilayer system computed from a reduced positron profile. The results of this method in Ti/Al samples are comparable to those using the common analysis based on positron diffusion equations. The positron analyses results were compared with SIMS profiles for the same samples.

  Info
Periodical
Materials Science Forum (Volumes 636-637)
Edited by
Luís Guerra ROSA and Fernanda MARGARIDO
Pages
1097-1101
DOI
10.4028/www.scientific.net/MSF.636-637.1097
Citation
M. Duarte Naia, P. M. Gordo, O. M.N.D. Teodoro, A. P. de Lima, A. M.C. Moutinho, "Characterisation of Ti/Al Multilayered Structures with Slow Positron Beams Applying a Simplified Positron Depth Distribution Model", Materials Science Forum, Vols. 636-637, pp. 1097-1101, 2010
Online since
January 2010
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