Paper Title:

Precession Electron Diffraction Assisted Orientation Mapping in the Transmission Electron Microscope

Periodical Materials Science Forum (Volume 644)
Main Theme Advanced Electron Microscopy and Nanomaterials
Edited by Arturo Ponce and Darío Bueno
Pages 1-7
DOI 10.4028/
Citation Joaquim Portillo et al., 2010, Materials Science Forum, 644, 1
Online since March 2010
Authors Joaquim Portillo, Edgar F. Rauch, Stavros Nicolopoulos, Mauro Gemmi, Daniel Bultreys
Keywords Crystal Orientation Mapping, Electron Backscatter Diffraction (EBSD), Phase Mapping, Precession Electron Diffraction (PED), TEM
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Precession electron diffraction (PED) is a new promising technique for electron diffraction pattern collection under quasi-kinematical conditions (as in X-ray Diffraction), which enables “ab-initio” solving of crystalline structures of nanocrystals. The PED technique may be used in TEM instruments of voltages 100 to 400 kV and is an effective upgrade of the TEM instrument to a true electron diffractometer. The PED technique, when combined with fast electron diffraction acquisition and pattern matching software techniques, may also be used for the high magnification ultra-fast mapping of variable crystal orientations and phases, similarly to what is achieved with the Electron Backscattered Diffraction (EBSD) technique in Scanning Electron Microscopes (SEM) at lower magnifications and longer acquisition times.