Paper Title:
Synthesis and Atomic Force Microscopy Contact Current Images of Aluminum Doped ZnO Thin Films
  Abstract

Aluminum doped ZnO thin films were synthesized by the water-mist assisted spray pyrolysis technique. The structural characterization by means of X-Ray diffraction measurements is reported. By means of Atomic Force Microscopy, the superficial electrical characteristics of the thin films are studied. Specifically, contact current images are shown and discussed. It is important to emphasize that in spite of no voltage is applied to the Atomic Force Microscopy contact conductive tip, current images are getting.

  Info
Periodical
Edited by
Arturo Ponce and Darío Bueno
Pages
109-112
DOI
10.4028/www.scientific.net/MSF.644.109
Citation
N. Muñoz Aguirre, J. E. Rivera-López, L. Martínez Pérez, P. A. Tamayo Meza, "Synthesis and Atomic Force Microscopy Contact Current Images of Aluminum Doped ZnO Thin Films", Materials Science Forum, Vol. 644, pp. 109-112, 2010
Online since
March 2010
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$32.00
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