Paper Title:

Investigation of 3C-SiC(111) Homoepitaxial Growth by CVD at High Temperature

Periodical Materials Science Forum (Volumes 645 - 648)
Main Theme Silicon Carbide and Related Materials 2009
Edited by Anton J. Bauer, Peter Friedrichs, Michael Krieger, Gerhard Pensl, Roland Rupp and Thomas Seyller
Pages 127-130
DOI 10.4028/www.scientific.net/MSF.645-648.127
Citation Nikoletta Jegenyes et al., 2010, Materials Science Forum, 645-648, 127
Online since April, 2010
Authors Nikoletta Jegenyes, Jean Lorenzzi, Veronique Soulière, Jacques Dazord, François Cauwet, Gabriel Ferro
Keywords Chemical Vapor Deposition (CVD), Homoepitaxy, Roughness
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Abstract

Starting from 3C-SiC(111) layers grown by Vapour-Liquid-Solid mechanism, homoepitaxial growth by Chemical Vapour Deposition was carried out on top of these seeds. The effect of the growth temperature and of the C/Si ratio in the gas phase was investigated on the surface morphology, the roughness and the defect density. It was found that the initial highly step-bunched surface of the VLS seeds could be greatly smoothen using appropriate conditions. These conditions were also found to reduce significantly the defect size and/or density at the surface.