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A New Technology of Boron Diffusion into Silicon by Rapid Thermal Processing

Journal Materials Science Forum (Volumes 65 - 66)
Volume Shallow Impurities in Semiconductors IV
Edited by Gordon Davies
Pages 29-34
DOI 10.4028/www.scientific.net/MSF.65-66.29
Citation Wan Quan Shi et al., 1991, Materials Science Forum, 65-66, 29
Authors Wan Quan Shi, Qing Run Hou, Shi Xiang Liu, Xue Jun Liu, Zheng Qing Fu, Zhi Jing He, L.W. Lu
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