Shallow States of the DX Centre in AlGaAs: Sn Probed by Admittance Spectroscopy |
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| Journal | Materials Science Forum (Volumes 65 - 66) |
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| Volume | Shallow Impurities in Semiconductors IV |
| Edited by | Gordon Davies |
| Pages | 471-0 |
| DOI | 10.4028/www.scientific.net/MSF.65-66.471 |
| Citation | S. Chakravarty et al., 1991, Materials Science Forum, 65-66, 471 |
| Authors | S. Chakravarty, S.V. Subramanian, B.M. Arora |
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