Domain Size Analysis in the Rietveld Method |
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| Journal | Materials Science Forum (Volume 651) |
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| Volume | Extending the Reach of Powder Diffraction Modelling |
| Edited by | Paolo Scardi and Robert E. Dinnebier |
| Pages | 187-200 |
| DOI | 10.4028/www.scientific.net/MSF.651.187 |
| Citation | W.I.F. David et al., 2010, Materials Science Forum, 651, 187 |
| Online since | May, 2010 |
| Authors | W.I.F. David, Matteo Leoni, Paolo Scardi |
| Keywords | Full Pattern Methods, Line Profile Analysis, Powder Diffraction, Whole Powder Pattern Modeling, X-Ray Diffraction (XRD) |
| Abstract | The implementation of a physically-sound size broadening model for peak profiles in the Rietveld method is presented. TOPAS macros are provided and the results compared with analogous modelling performed according to advanced analysis methods such as the Whole Powder Pattern Modelling. |
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