Paper Title:
Challenges Associated with the Characterisation of Nanocrystalline Materials Using Atom Probe Tomography
  Abstract

Atom probe tomography provides compositional information in three dimensions at the atomic scale, and is therefore extremely suited to the study of nanocrystalline materials. In this paper we present atom probe results from the investigation of nanocomposite TiSi¬Nx coatings and nanocrystalline Al. We address some of the major challenges associated with the study of nanocrystalline materials, including specimen preparation, visualisation, common artefacts in the data and approaches to quantitative analysis. We also discuss the potential for the technique to relate crystallographic information to the compositional maps.

  Info
Periodical
Materials Science Forum (Volumes 654-656)
Main Theme
Edited by
Jian-Feng Nie and Allan Morton
Pages
2366-2369
DOI
10.4028/www.scientific.net/MSF.654-656.2366
Citation
F. Z. Tang, T. Alam, M. P. Moody, B. Gault, J. M. Cairney, "Challenges Associated with the Characterisation of Nanocrystalline Materials Using Atom Probe Tomography", Materials Science Forum, Vols. 654-656, pp. 2366-2369, 2010
Online since
June 2010
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