Paper Title:

Preparation of the Kondo Insulators FeSi by Magnetron Sputtering

Periodical Materials Science Forum (Volumes 663 - 665)
Main Theme Optoelectronic Materials
Edited by Yuan Ming Huang
Pages 1129-1132
DOI 10.4028/www.scientific.net/MSF.663-665.1129
Citation Jin Min Zhang et al., 2010, Materials Science Forum, 663-665, 1129
Online since November, 2010
Authors Jin Min Zhang, Quan Xie, Vesna Borjanović, Yan Liang, Wu Xian Zeng, Da Peng Fu, Dao Jing Ma, Yan Wang
Keywords Crystalline, Kondo Insulator, Magnetron Sputtering, Sputtering Parameter
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Abstract

The Kondo insulator FeSi was prepared by DC magnetron sputtering and the effects of sputtering parameters on the formation of FeSi were investigated in detail. The formation of monosilicide FeSi was clarified using X-ray diffraction (XRD) and its microstructure was characterized by scanning electron microscopy (SEM). The results indicate that the sputtering gas pressure, the sputtering power and the Ar flux all have significantly effects on formation of FeSi and the crystalline of the film. The sputtering gas pressure has effects on sputtering yields, depositing rate and the energy of sputtering atoms, the sputtering power has effects on the kinetic energy and the diffusion ability of deposing atoms and the gas flux has the effects on the flowing state of Ar gas. The most optimal sputtering parameters for the preparation of the Kondo insulator FeSi by DC magnetron sputtering are given: 1.5 Pa for sputtering Ar pressure, 100 W for sputtering power and 20 SCCM for sputtering Ar flux.