Paper Title:
Study on the Evolution of Surface Morphology of Hetero-Epitaxy Growth of ZnO Thin Film
  Abstract

Nano-granular ZnO thin films were deposited on Si (100) by molecular beam epitaxy (MBE) by varying growth time. The atomic force microscopy (AFM) and Raman scattering experiments were performed to study the surface morphology and vibrational properties of ZnO layer. The results show that the ZnO thin film grows in the Stranski-Kranstanow (SK) mode, and the critical thickness in our experimental condition is between 5.5 and 8.2 nm.

  Info
Periodical
Materials Science Forum (Volumes 663-665)
Edited by
Yuan Ming Huang
Pages
1205-1208
DOI
10.4028/www.scientific.net/MSF.663-665.1205
Citation
J. Z. Xiao, J. A. C. Paixão, Q. J. Jia, "Study on the Evolution of Surface Morphology of Hetero-Epitaxy Growth of ZnO Thin Film", Materials Science Forum, Vols. 663-665, pp. 1205-1208, 2011
Online since
November 2010
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