Paper Title:
Evidence of Responsivity and Breakdown Voltage Improvement in SiCGe/SiC Phototransistor with Charge Compensation Layer
  Abstract

An n-SiC/p-SiCGe/n-SiCGe heterojunction phototransistor with charge compensation layer has been simulated with commercial simulator MEDICI. With wide bandgap SiC emitter and p-type SiCGe charge-compensation layer, device responsivity and breakdown voltage has been improved. It is found that with p-type SiCGe layer, the responsivity is nearly two times of without one. Furthermore, flat electrical field distribution during off-state enable it supports higher reverse bias, thus breakdown voltage increased from 450V to 580V for the given structure, and both breakdown voltage and responsivity increase with light absorption region length.

  Info
Periodical
Materials Science Forum (Volumes 663-665)
Edited by
Yuan Ming Huang
Pages
494-497
DOI
10.4028/www.scientific.net/MSF.663-665.494
Citation
L. Cao, H. B. Pu, Z. M. Chen, T. Lin, S. J. Zhou, "Evidence of Responsivity and Breakdown Voltage Improvement in SiCGe/SiC Phototransistor with Charge Compensation Layer", Materials Science Forum, Vols. 663-665, pp. 494-497, 2011
Online since
November 2010
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