Paper Title:
Testing an Ortec Lifetime System
  Abstract

We report preliminary performance tests of an ORTEC PLS lifetime system based on plastic scintillators and analog electronic system. A variety of samples was measured, from metals (Cu, stainless steel), across semiconductors (Cz-grown silicon, ZnSe) to nanostructured ceramics (ZrO2). All results obtained are compatible with literature reports and indicate the lifetime resolution of the whole system as 180 ps.

  Info
Periodical
Edited by
Radosław Zaleski
Pages
155-159
DOI
10.4028/www.scientific.net/MSF.666.155
Citation
A. Karbowski, J. D. Fidelus, G. P. Karwasz, "Testing an Ortec Lifetime System", Materials Science Forum, Vol. 666, pp. 155-159, 2011
Online since
December 2010
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