Paper Title:
Highly Textured (111) Pt Substrates for Preferred Orientation Controlled AlN Films
  Abstract

Preferred orientation of AlN films has been improved to c-axis using a highly (111) textured Pt layer. The highly textured (111) Pt layer is obtained by inserting an AlN layer between the Pt layer and substrate. Thus, Pt/AlN/substrate could be termed a substrate for preferred orientation controlled AlN films. X-ray diffraction (XRD) profiles reveal that the degree of preferred orientation of such highly (111) textured Pt layer surpasses the one originated from the crystal structure of Pt. The (2θ, ψ) intensify maps of diffracted X-ray collected as a function of the diffraction angle (2θ) and the tilting angle (ψ) exhibit that the films are perfectly (111) preferred orientated, however, they do not show in-plane texture. The (2θ, ψ) maps also demonstrate that a residual stress in films is subject to compressive.

  Info
Periodical
Materials Science Forum (Volumes 675-677)
Edited by
Yi Tan and Dongying Ju
Pages
1259-1262
DOI
10.4028/www.scientific.net/MSF.675-677.1259
Citation
T. Harumoto, S. Muraishi, J. Shi, Y. Nakamura, "Highly Textured (111) Pt Substrates for Preferred Orientation Controlled AlN Films", Materials Science Forum, Vols. 675-677, pp. 1259-1262, 2011
Online since
February 2011
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$32.00
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