Paper Title:
In Situ Stress Measurement Method Based on X-Ray Diffraction under Biaxial Tensile Loading
  Abstract

The purpose of this investigation is to detect damage from stress distribution in the surface of near pre-crack tip by using X-ray diffraction technique during biaxial tension test. An measurements apparatus to measure stress distribution along pre-crack direction was fabrication by use of a biaxial tensile test device and a stress analyzer based on single exposure technique with one position sensitive proportional counter. Stress distribution with different tensile applied stress ratios were measured during biaxial tension test. As results, the shape of actual stress was keeping increase with increasing tensile applied stress. At maximum applied stress, the residual stress increases with the increasing distance from the crack tip; after reaching a maximum it gradually diminish.

  Info
Periodical
Materials Science Forum (Volumes 675-677)
Edited by
Yi Tan and Dongying Ju
Pages
615-618
DOI
10.4028/www.scientific.net/MSF.675-677.615
Citation
D. Y. Ju, J.G. Wang, M. Abe, "In Situ Stress Measurement Method Based on X-Ray Diffraction under Biaxial Tensile Loading", Materials Science Forum, Vols. 675-677, pp. 615-618, 2011
Online since
February 2011
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Price
$32.00
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