On Faulting in Nanocrystallites of FCC Metals |
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| Journal | Materials Science Forum (Volume 681) |
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| Volume | Residual Stresses VIII |
| Edited by | Paolo Scardi and Cristy L. Azanza Ricardo |
| Pages | 13-18 |
| DOI | 10.4028/www.scientific.net/MSF.681.13 |
| Citation | Kenneth R. Beyerlein et al., 2011, Materials Science Forum, 681, 13 |
| Online since | March, 2011 |
| Authors | Kenneth R. Beyerlein, Matteo Leoni, Robert L. Snyder, Paolo Scardi |
| Keywords | Debye Function, Faulting, Line Profile Analysis, X-Ray Powder Diffraction |
| Abstract | Patterns calculated by applying the Debye function to faulted spherical nanoparticles are used to test the accuracy of modern Line Profile Analysis theory of faulting for small crystallites. The relative deviation of the determined fault density is found to be dependent on the fault position, and on the particle size. The study of the average pattern from systems of 100 particles (D = 9.8nm) shows an overestimated deviation of the determined fault density by as much as 30%. |
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