Paper Title:
MicroGap Area Detector for Stress and Texture Analysis
  Abstract

Two-dimensional x-ray diffraction is an ideal method for examining the residual stress and texture. The most dramatic development in two-dimensional x-ray diffractometry involves three critical devices, including x-ray sources, x-ray optics and detectors. The recent development in brilliant x-rays sources and high efficiency x-ray optics provided high intensity x-ray beam with the desired size and divergence. Correspondingly, the detector used in such a high performance system requires the capability to collect large two-dimensional images with high counting rate and high resolution. This paper introduces the diffraction vector approach in two-dimensional x-ray diffraction for stress and texture analysis, and an innovative large area detector based on the MikroGap™ technology.

  Info
Periodical
Edited by
Paolo Scardi and Cristy L. Azanza Ricardo
Pages
19-24
DOI
10.4028/www.scientific.net/MSF.681.19
Citation
B. B. He, "MicroGap Area Detector for Stress and Texture Analysis", Materials Science Forum, Vol. 681, pp. 19-24, 2011
Online since
March 2011
Authors
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Price
$32.00
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