Paper Title:
60Co Gamma–Ray Irradiation Effects on Pentacene-Based Organic Thin-Film Transistors
  Abstract

Electrical characterization of 60Co γ-ray radiation effects on pentacene-based organic thin-film-transistors having two kinds of gate insulator have been carried out. For transistors with SiO2 gate insulator, the threshold voltage shifts are consistent with positive charge trapping in the oxide and a “rebound” effect is observed. This “rebound” effect is attributed to the negatively charged interface traps generated during irradiation. For polyimide gate insulator, the threshold voltage continually decreases with an increasing total-dose. At total-dose of 1200 Gy (Si), for the SiO2 gate insulator, the field-effect mobility decreased by almost 80%, and for polyimide gate insulator, it decreased by 40%.

  Info
Periodical
Edited by
Chengming Li, Chengbao Jiang, Zhiyong Zhong and Yichun Zhou
Pages
576-579
DOI
10.4028/www.scientific.net/MSF.687.576
Citation
L. Cai, T. Hirao, H. Yano, Z. F. Duan, H. Takayanagi, H. Ueki, T. Ohshima, Y. Nishioka, "60Co Gamma–Ray Irradiation Effects on Pentacene-Based Organic Thin-Film Transistors", Materials Science Forum, Vol. 687, pp. 576-579, 2011
Online since
June 2011
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