Paper Title:
The Pair-Doped Delta-Superlattice: An Inner Probe to Measure Monolayer Doping Fluctuations in Semiconductors
  Abstract

  Info
Periodical
Edited by
G. Minchev and L. Pramatarova
Pages
139-150
DOI
10.4028/www.scientific.net/MSF.69.139
Citation
A. Zehe, "The Pair-Doped Delta-Superlattice: An Inner Probe to Measure Monolayer Doping Fluctuations in Semiconductors", Materials Science Forum, Vol. 69, pp. 139-150, 1991
Online since
January 1991
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Price
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