Paper Title:
Determination of the Epitaxial Strains of a Thermally Grown Oxide on a Metallic Substrate
  Abstract

A generalization of the Bollmann’s method is used to evaluate the epitaxial strains at the metal/oxide interface. The numerical approach is described and applied to the Ni/NiO system in order to study the result sensitivity to some numerical parameters.

  Info
Periodical
Edited by
Toshio Maruyama, Masayuki Yoshiba, Kazuya Kurokawa, Yuuzou Kawahara and Nobuo Otsuka
Pages
176-182
DOI
10.4028/www.scientific.net/MSF.696.176
Citation
L. Kurpaska, J. Favergeon, L. Lahoche, G. Moulin, J. M. Roelandt, "Determination of the Epitaxial Strains of a Thermally Grown Oxide on a Metallic Substrate", Materials Science Forum, Vol. 696, pp. 176-182, 2011
Online since
September 2011
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